Pixel super-resolution metrology

We have developed a compact device that can sense wavelengths or the angles between two beams with very high resolution. It can be built without moving parts, and uses only a CMOS or CCD camera chip. We found that the large-angle interference pattern of two beams, which has a periodicity much smaller than the pixel size, can be analyzed with high precision by the aliases or subsampling! The principle opens a new avenue for wavelength sensing (wavemeter).

Pixel super-resolution interference pattern sensing via the aliasing effect for laser frequency metrology
Lipeng Wan, Tianbao Yu, Daomu Zhao, Wolfgang Löffler
Laser & Photonics Reviews 17, 2200994 (2023), Arxiv:2212.09373

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The principle:

Our prototype: